tools/testing/nvdimm: Populate dirty shutdown data

Allow the unit tests to verify the retrieval of the dirty shutdown
count via smart commands, and allow the driver-load-time retrieval of
the smart health payload to be simulated by nfit_test.

Reviewed-by: Keith Busch <keith.busch@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>

diff --git a/drivers/acpi/nfit/core.c b/drivers/acpi/nfit/core.c
index bf7021bb276cfaa0c466afa6c7484474244a33fb..ec8fb578fa36a456f6a333896e4dc5c138f2278a 100644 (file)
--- a/drivers/acpi/nfit/core.c
+++ b/drivers/acpi/nfit/core.c
@@ -1721,7 +1721,7 @@ static bool acpi_nvdimm_has_method(struct acpi_device *adev, char *method)
        return false;
 }
 
-static void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem)
+__weak void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem)
 {
        struct nd_intel_smart smart = { 0 };
        union acpi_object in_buf = {
@@ -1785,8 +1785,11 @@ static int acpi_nfit_add_dimm(struct acpi_nfit_desc *acpi_desc,
        nfit_mem->dsm_mask = acpi_desc->dimm_cmd_force_en;
        nfit_mem->family = NVDIMM_FAMILY_INTEL;
        adev = to_acpi_dev(acpi_desc);
-       if (!adev)
+       if (!adev) {
+               /* unit test case */
+               populate_shutdown_status(nfit_mem);
                return 0;
+       }
 
        adev_dimm = acpi_find_child_device(adev, device_handle, false);
        nfit_mem->adev = adev_dimm;

diff --git a/tools/testing/nvdimm/Kbuild b/tools/testing/nvdimm/Kbuild
index 0392153a0009b04455c49938f931784d47ad9544..778ceb651000236d8fee47c74ac7b7d823f8f503 100644 (file)
--- a/tools/testing/nvdimm/Kbuild
+++ b/tools/testing/nvdimm/Kbuild
@@ -22,6 +22,7 @@ NVDIMM_SRC := $(DRIVERS)/nvdimm
 ACPI_SRC := $(DRIVERS)/acpi/nfit
 DAX_SRC := $(DRIVERS)/dax
 ccflags-y := -I$(src)/$(NVDIMM_SRC)/
+ccflags-y += -I$(src)/$(ACPI_SRC)/
 
 obj-$(CONFIG_LIBNVDIMM) += libnvdimm.o
 obj-$(CONFIG_BLK_DEV_PMEM) += nd_pmem.o

diff --git a/tools/testing/nvdimm/acpi_nfit_test.c b/tools/testing/nvdimm/acpi_nfit_test.c
index 43521512e577cea0c0c3835a2b2f51dc46eb3573..fec8fb1b7715eb9f6aa441703ed9eccebef872bd 100644 (file)
--- a/tools/testing/nvdimm/acpi_nfit_test.c
+++ b/tools/testing/nvdimm/acpi_nfit_test.c
@@ -4,5 +4,13 @@
 #include <linux/module.h>
 #include <linux/printk.h>
 #include "watermark.h"
+#include <nfit.h>
 
 nfit_test_watermark(acpi_nfit);
+
+/* strong / override definition of nfit_intel_shutdown_status */
+void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem)
+{
+       set_bit(NFIT_MEM_DIRTY_COUNT, &nfit_mem->flags);
+       nfit_mem->dirty_shutdown = 42;
+}

diff --git a/tools/testing/nvdimm/test/nfit.c b/tools/testing/nvdimm/test/nfit.c
index f1a2a1a7bb1b29295e479342a39a111eb0da3fef..9527d47a1070ecbabc716273d6e46f34e18c1ca1 100644 (file)
--- a/tools/testing/nvdimm/test/nfit.c
+++ b/tools/testing/nvdimm/test/nfit.c
@@ -149,6 +149,7 @@ static const struct nd_intel_smart smart_def = {
                | ND_INTEL_SMART_ALARM_VALID
                | ND_INTEL_SMART_USED_VALID
                | ND_INTEL_SMART_SHUTDOWN_VALID
+               | ND_INTEL_SMART_SHUTDOWN_COUNT_VALID
                | ND_INTEL_SMART_MTEMP_VALID
                | ND_INTEL_SMART_CTEMP_VALID,
        .health = ND_INTEL_SMART_NON_CRITICAL_HEALTH,
@@ -161,8 +162,8 @@ static const struct nd_intel_smart smart_def = {
        .ait_status = 1,
        .life_used = 5,
        .shutdown_state = 0,
+       .shutdown_count = 42,
        .vendor_size = 0,
-       .shutdown_count = 100,
 };
 
 struct nfit_test_fw {