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(parent: e4ce9c5) | patch
[MTD] NAND: Fix broken bad block scan for 16 bit devices
authorThomas Gleixner <tglx@linutronix.de>
Fri, 15 Jul 2005 13:53:51 +0000 (14:53 +0100)
committerThomas Gleixner <tglx@mtd.linutronix.de>
Sat, 16 Jul 2005 07:27:52 +0000 (09:27 +0200)
commit52792123a32070cb67ec7d84805ef9fe8a2f0383
tree3f8d07e75dc9895c52c2184d28e3c43a84b0234btree | snapshot
parente4ce9c5faaafa18cdecf251eb2e99b52b9bb750acommit | diff
[MTD] NAND: Fix broken bad block scan for 16 bit devices

The previous change to read a single byte from oob breaks the
bad block scan on 16 bit devices, when the byte is on an odd
address. Read the complete oob for now.
Remove the unused arguments from check_short_pattern()
Move the wait for ready function so it is only executed when
consecutive reads happen.

Signed-off-by: Thomas Gleixner <tglx@linutronix.de>
drivers/mtd/nand/nand_base.c diff | blob | history
drivers/mtd/nand/nand_bbt.c diff | blob | history
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