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(parent: aef5464) | patch
USB: keyspan: remove bogus disconnect test in close
authorJohan Hovold <jhovold@gmail.com>
Thu, 21 Mar 2013 11:36:32 +0000 (12:36 +0100)
committerGreg Kroah-Hartman <gregkh@linuxfoundation.org>
Mon, 25 Mar 2013 20:44:17 +0000 (13:44 -0700)
commit1f02b85d226ab038ef09c6d4322648a1ef0d6846
tree4a2d1ad2f217cf004f770e437a1d832122f541eftree | snapshot
parentaef546499e388019e6811f7b6a9d5a1e34c00719commit | diff
USB: keyspan: remove bogus disconnect test in close

Remove bogus (and unnecessary) test for serial->dev being NULL in close.

The device is never cleared, and close is never called after a completed
disconnect anyway.

Remove some out-commented bogus code while at it.

Signed-off-by: Johan Hovold <jhovold@gmail.com>
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
drivers/usb/serial/keyspan.c diff | blob | history
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