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media: i2c: ov772x: Add test pattern control
authorLad Prabhakar <prabhakar.mahadev-lad.rj@bp.renesas.com>
Fri, 2 Oct 2020 22:23:23 +0000 (00:23 +0200)
committerMauro Carvalho Chehab <mchehab+huawei@kernel.org>
Mon, 16 Nov 2020 09:31:14 +0000 (10:31 +0100)
commit6fa51cd2fe5cda7dcfe562282932b9dcc682287a
tree50bc3972fe78936f285cf1a2e2ea24b7f3baddc9tree | snapshot
parent78e654d5b4c764989ecf8974f25fc054d4ba0f84commit | diff
media: i2c: ov772x: Add test pattern control

Add support for test pattern control supported by the sensor.

Signed-off-by: Lad Prabhakar <prabhakar.mahadev-lad.rj@bp.renesas.com>
Reviewed-by: Biju Das <biju.das.jz@bp.renesas.com>
Reviewed-by: Jacopo Mondi <jacopo@jmondi.org>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab+huawei@kernel.org>
drivers/media/i2c/ov772x.c diff | blob | history
Linux Kernel Source Tree.