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(parent: a67dd87) | patch
test_bpf: extend tests for 32-bit endianness conversion
authorXi Wang <xi.wang@gmail.com>
Wed, 8 Jul 2015 21:00:56 +0000 (14:00 -0700)
committerDavid S. Miller <davem@davemloft.net>
Wed, 8 Jul 2015 23:19:53 +0000 (16:19 -0700)
commit4c23ed57935a86c4f4d74019faa783fcde29e53f
tree96815c89643734aba98bd63bb68454dd92547eabtree | snapshot
parenta67dd87f393336ccfffb902e0da62ddcc14d47f0commit | diff
test_bpf: extend tests for 32-bit endianness conversion

Currently "ALU_END_FROM_BE 32" and "ALU_END_FROM_LE 32" do not test if
the upper bits of the result are zeros (the arm64 JIT had such bugs).
Extend the two tests to catch this.

Acked-by: Daniel Borkmann <daniel@iogearbox.net>
Acked-by: Alexei Starovoitov <ast@plumgrid.com>
Signed-off-by: Xi Wang <xi.wang@gmail.com>
Signed-off-by: David S. Miller <davem@davemloft.net>
lib/test_bpf.c diff | blob | history
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