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media: ov7670: add V4L2_CID_TEST_PATTERN control
authorAkinobu Mita <akinobu.mita@gmail.com>
Fri, 24 Nov 2017 14:40:45 +0000 (09:40 -0500)
committerMauro Carvalho Chehab <mchehab@s-opensource.com>
Fri, 8 Dec 2017 14:23:12 +0000 (09:23 -0500)
commit386f0368858dd8a00cac8a3dd869825ea91fb682
tree08408a95f73dece6f311a3b31b25b19f42554ae6tree | snapshot
parentc0cad9e12ae1c25ece496988250b2f03a8fa058ecommit | diff
media: ov7670: add V4L2_CID_TEST_PATTERN control

The ov7670 has the test pattern generator features.  This makes use of
it through V4L2_CID_TEST_PATTERN control.

Cc: Jonathan Corbet <corbet@lwn.net>
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab@s-opensource.com>
drivers/media/i2c/ov7670.c diff | blob | history
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